30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

 | Post date: 2019/01/26 | 
30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

30th European Symposium on Reliability of

Electron Devices, Failure Physics and Analysis

ESREF 2019, the 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, will take place in Toulouse (France) from 23th to 26th September 2019 at Centre de Congrès Pierre Baudis.

This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

Papers are requested on the following topics:

A - Quality and Reliability assessment techniques and methods for Devices and Systems
B – Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
C – Progress in Failure Analysis: Defect Detection and Analysis
D – Reliability of Microwave devices and circuits
E - Packaging and Assembly Reliability and Failure Analysis
F - Power Devices and Electronic System : Reliability and Failure Analysis
G – Photonics ReliabilityH – MEMS and sensors ReliabilityI - Extreme environments and Radiation
SS : Special Session "Space and Aeronautic systems"

Deadlines :

11 March 2019 Submission of 4-6 pages full paper
29 April 2019    Notification of acceptance
20 May 2019 Submission of the corrected paper following the reviewers comments
10 June 2019 Upload of final paper to the online Elsevier Editorial System (EES)

URL: https://esref2019.sciencesconf.org/

Keywords: France | Toulouse | ESREF 20119 | ESREF | Reliability | Conference | Symposium | Centre de Congrès Pierre Baudis |



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© 2019 by the authors. Licensee IUST, Tehran, Iran. This is an open access journal distributed under the terms and conditions of the Creative Commons Attribution-NonCommercial 4.0 International (CC BY-NC 4.0) license.