<?xml version="1.0" encoding="utf-8"?>
<journal>
<title>IRANIAN JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING</title>
<title_fa></title_fa>
<short_title>IJEEE</short_title>
<subject>Engineering &amp; Technology</subject>
<web_url>http://ijeee.iust.ac.ir</web_url>
<journal_hbi_system_id>18</journal_hbi_system_id>
<journal_hbi_system_user>agent2</journal_hbi_system_user>
<journal_id_issn>1735-2827</journal_id_issn>
<journal_id_issn_online>1735-2827</journal_id_issn_online>
<journal_id_pii></journal_id_pii>
<journal_id_doi></journal_id_doi>
<journal_id_iranmedex></journal_id_iranmedex>
<journal_id_magiran></journal_id_magiran>
<journal_id_sid></journal_id_sid>
<journal_id_nlai></journal_id_nlai>
<journal_id_science></journal_id_science>
<language>en</language>
<pubdate>
	<type>jalali</type>
	<year>1405</year>
	<month>6</month>
	<day>1</day>
</pubdate>
<pubdate>
	<type>gregorian</type>
	<year>2026</year>
	<month>9</month>
	<day>1</day>
</pubdate>
<volume>22</volume>
<number>3</number>
<publish_type>online</publish_type>
<publish_edition>1</publish_edition>
<article_type>fulltext</article_type>
<articleset>
	<article>


	<language>en</language>
	<article_id_doi></article_id_doi>
	<title_fa></title_fa>
	<title>Power-Gated Memristor-Based Optimized PIPO Shift Register</title>
	<subject_fa>2-VLSI</subject_fa>
	<subject>VLSI</subject>
	<content_type_fa>Research Paper </content_type_fa>
	<content_type>Research Paper </content_type>
	<abstract_fa></abstract_fa>
	<abstract>&lt;span lang=&quot;EN-IN&quot; style=&quot;font-size:10.0pt&quot;&gt;&lt;span style=&quot;font-family:&amp;quot;Times New Roman&amp;quot;,serif&quot;&gt;Memristors are a viable future semiconductor memory substitute because of its nanoscale size, quick switching, low power consumption, and CMOS compatibility.&lt;/span&gt;&lt;/span&gt;&lt;span lang=&quot;EN-IN&quot; style=&quot;font-size:10.0pt&quot;&gt;&lt;span style=&quot;font-family:&amp;quot;Times New Roman&amp;quot;,serif&quot;&gt; CMOS flip-flops face drawbacks like large size, high power use, and charge loss at smaller scales.&lt;/span&gt;&lt;/span&gt;&lt;span style=&quot;font-size:10.0pt&quot;&gt;&lt;span style=&quot;font-family:&amp;quot;Times New Roman&amp;quot;,serif&quot;&gt; However, memristors provide a novel approach to the construction of FFs that improves outcomes. In the previous work, the execution of a four-bit PIPO shift register design was demonstrated using a D flip-flop. D Flip-flops are designed with NAND Gates. In this paper, we will improve the performance of flip-flops by using memristors, followed by the performance of D flip-flops and PIPO shift register using the Power Gating Technique. As the Results Session displays the power usage of the NAND Gate. The power consumption of a D flip-flop using the memristor design is 6.182&lt;/span&gt;&lt;/span&gt;&lt;span style=&quot;font-size:10.0pt&quot;&gt;&lt;span style=&quot;font-family:&amp;quot;Times New Roman&amp;quot;,serif&quot;&gt; &amp;micro;W, while using the power gating technique, the power usage of D flip-flop is 5.827 &amp;micro;W. For DFF Power reduced by 86.1%, Delay reduced by 47.1% and PDP improved by 99.86% compared to conventional design. The power consumption of a PIPO using the memristor design is 22.52 &amp;micro;W, while using the power gating technique, the power usage of PIPO is 21.28 &amp;micro;W. The power consumption of PIPO circuit is reduced by 98.3% compared with conventional design.&lt;/span&gt;&lt;/span&gt;&lt;span style=&quot;color:#000000;&quot;&gt;&lt;span style=&quot;font-size:10pt&quot;&gt;&lt;span new=&quot;&quot; roman=&quot;&quot; times=&quot;&quot;&gt;&lt;span style=&quot;color:#5b9bd5&quot;&gt;&lt;/span&gt;&lt;/span&gt;&lt;/span&gt;&lt;br&gt;
&amp;nbsp;&lt;/span&gt;</abstract>
	<keyword_fa></keyword_fa>
	<keyword>Flip-flops, NAND Gate, Memristor, Power Gating, Parallel in parallel Out</keyword>
	<start_page>4056</start_page>
	<end_page>4056</end_page>
	<web_url>http://ijeee.iust.ac.ir/browse.php?a_code=A-10-6012-1&amp;slc_lang=en&amp;sid=1</web_url>


<author_list>
	<author>
	<first_name>E</first_name>
	<middle_name></middle_name>
	<last_name>Vijaya Babu</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email></email>
	<code>1800319475328460017609</code>
	<orcid>1800319475328460017609</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of ECE, Vallurupalli Nageswara Rao Vignana Jyothi Institute of Engineering and Technology, Bachupally, Hyderabad, India</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>G</first_name>
	<middle_name></middle_name>
	<last_name>Shanthi</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email>shanthi_g@vnrvjiet.in</email>
	<code>1800319475328460017608</code>
	<orcid>1800319475328460017608</orcid>
	<coreauthor>Yes
</coreauthor>
	<affiliation>Department of ECE, Vallurupalli Nageswara Rao Vignana Jyothi Institute of Engineering and Technology, Bachupally, Hyderabad, India</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>Ayesha</first_name>
	<middle_name></middle_name>
	<last_name>Thabassum Ara</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email></email>
	<code>1800319475328460017610</code>
	<orcid>1800319475328460017610</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of ECE, Vallurupalli Nageswara Rao Vignana Jyothi Institute of Engineering and Technology, Bachupally, Hyderabad, India</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>K V</first_name>
	<middle_name></middle_name>
	<last_name>Balaramakrishna</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email></email>
	<code>1800319475328460017611</code>
	<orcid>1800319475328460017611</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of ECE, Aditya University, Surampalem, India</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>Madhu</first_name>
	<middle_name></middle_name>
	<last_name>Nakirekanti</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email></email>
	<code>1800319475328460017612</code>
	<orcid>1800319475328460017612</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>AVN institute of Engineering and Technology, Hyderabad, India</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>K</first_name>
	<middle_name></middle_name>
	<last_name>Narsimha Reddy</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email></email>
	<code>1800319475328460017613</code>
	<orcid>1800319475328460017613</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of ECE, Vardhaman College of Engineering, Hyderabad, India</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


</author_list>


	</article>
</articleset>
</journal>
