<?xml version="1.0" encoding="utf-8"?>
<journal>
<title>IRANIAN JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING</title>
<title_fa></title_fa>
<short_title>IJEEE</short_title>
<subject>Engineering &amp; Technology</subject>
<web_url>http://ijeee.iust.ac.ir</web_url>
<journal_hbi_system_id>18</journal_hbi_system_id>
<journal_hbi_system_user>agent2</journal_hbi_system_user>
<journal_id_issn>1735-2827</journal_id_issn>
<journal_id_issn_online>1735-2827</journal_id_issn_online>
<journal_id_pii></journal_id_pii>
<journal_id_doi></journal_id_doi>
<journal_id_iranmedex></journal_id_iranmedex>
<journal_id_magiran></journal_id_magiran>
<journal_id_sid></journal_id_sid>
<journal_id_nlai></journal_id_nlai>
<journal_id_science></journal_id_science>
<language>en</language>
<pubdate>
	<type>jalali</type>
	<year>1404</year>
	<month>8</month>
	<day>1</day>
</pubdate>
<pubdate>
	<type>gregorian</type>
	<year>2025</year>
	<month>11</month>
	<day>1</day>
</pubdate>
<volume>21</volume>
<number>4</number>
<publish_type>online</publish_type>
<publish_edition>1</publish_edition>
<article_type>fulltext</article_type>
<articleset>
	<article>


	<language>en</language>
	<article_id_doi></article_id_doi>
	<title_fa></title_fa>
	<title>4-18 GHz Zero-Bias Asymmetrical Spacer Layer Tunnel Diode Detector</title>
	<subject_fa>2-Semiconductor Devices </subject_fa>
	<subject>Semiconductor Devices </subject>
	<content_type_fa>Research Paper </content_type_fa>
	<content_type>Research Paper </content_type>
	<abstract_fa></abstract_fa>
	<abstract>&lt;div dir=&quot;rtl&quot; style=&quot;text-align: left;&quot;&gt;&lt;span style=&quot;font-family:Times New Roman;&quot;&gt;&lt;span style=&quot;font-size:12.0pt&quot;&gt;An analysis of 6&amp;times;6 &amp;micro;m&lt;sup&gt;2 &lt;/sup&gt;GaAs/AlAs Asymmetric Spacer Layer Tunnel diode has been conducted to evaluate the DC and RF characteristics at different bias conditions. At zero voltage operation, the diode exhibited a measured curvature coefficient of 22 V&lt;sup&gt;-1&lt;/sup&gt;, corresponding to a junction resistance of 27 &lt;/span&gt;&lt;span lang=&quot;EN-GB&quot; style=&quot;font-size:12.0pt&quot;&gt;kΩ. &lt;/span&gt;&lt;span style=&quot;font-size:12.0pt&quot;&gt;The measured and simulated S&lt;sub&gt;11&lt;/sub&gt; &lt;/span&gt;&lt;span style=&quot;font-size:16px;&quot;&gt;reflection coefficient of the integrated detector including the diode, matching circuit, and output capacitance achieved to be less than -10 dB at the desired frequency. The extracted low series resistance and junction capacitance of the tunnel diode resulted a high voltage sensitivity of 3650 V/W and low noise equivalent power of&lt;/span&gt;&lt;span style=&quot;font-size:12.0pt&quot;&gt; &lt;/span&gt;&lt;span style=&quot;font-size:12.0pt&quot;&gt;5.5 pW/&lt;/span&gt;&lt;span lang=&quot;EN-GB&quot; style=&quot;font-size:12.0pt&quot;&gt;&lt;span style=&quot;position:relative&quot;&gt;&lt;span style=&quot;top:3.0pt&quot;&gt;&lt;img alt=&quot;&quot; id=&quot;_x0000_i1025&quot; src=&quot;data:image/png;base64,iVBORw0KGgoAAAANSUhEUgAAAB4AAAAVCAIAAADelck2AAAAAXNSR0IArs4c6QAAAAlwSFlzAAAOxAAADsQBlSsOGwAAARlJREFUSEvVlUEWgiAQhrGz9Fp5gjxBu05B19FrtGoTXsRVeBeaAQQGGX3pc9HsDPj4559fq4wx4pg6HYNF6oFoAYZwpeSulhZU96+h1Qs3ry3x6PEz1JfzDt0senw/6/ttB5kdY04eu6ay1XSjva9/uOfww1wF45iS18xo3V6FkCq6b6csFWs5k5A52SApBfmr+GF6tNYkC1vI86ga3UrolCgCQXmjVmNeqWewITyCMnBOGNRLm2PIxHw8kU/DeeO4+GnyXmE7fmuBXDS6RA7cBG0Pu81bjKZ6ndyYkClcDDnzNfQ4JSTRq0EmzCoNnxUORQMdB+hHG6IQNwKXjhiXSK7tofJw1r5FhXX6yqDChffrN371l39gX47PfRujsvbIAAAAAElFTkSuQmCC&quot; style=&quot;width:22.5pt; height:15.75pt&quot; &gt; &lt;/span&gt;&lt;/span&gt;&lt;/span&gt;&lt;span style=&quot;font-size:12.0pt&quot;&gt;&amp;nbsp;at 11 GHz&amp;nbsp;&lt;/span&gt;&lt;/span&gt;&lt;span style=&quot;font-size:10.0pt&quot;&gt;&lt;span new=&quot;&quot; roman=&quot;&quot; style=&quot;font-family:&quot; times=&quot;&quot;&gt;&lt;span style=&quot;font-size:16px;&quot;&gt;resonant frequency and -27 dBm input power. The developed detector model can be extended to implement RF detectors operating at frequencies reaching mm-wave regime applications. This is with consideration of the requirements for sub-micrometer scale mesa devices, eliminating the effects of associated parasitic elements and improved matching network performance&lt;/span&gt;.&lt;/span&gt;&lt;/span&gt;&lt;/div&gt;</abstract>
	<keyword_fa></keyword_fa>
	<keyword>ASPAT Detector, ADS Model, Reflection Coefficient, Noise Equivalent Power.</keyword>
	<start_page>105</start_page>
	<end_page>114</end_page>
	<web_url>http://ijeee.iust.ac.ir/browse.php?a_code=A-10-5520-1&amp;slc_lang=en&amp;sid=1</web_url>


<author_list>
	<author>
	<first_name>Omar S</first_name>
	<middle_name></middle_name>
	<last_name>Abdulwahid</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email>Omar.abdulwahid@uomosul.edu.iq</email>
	<code>1800319475328460017210</code>
	<orcid>1800319475328460017210</orcid>
	<coreauthor>Yes
</coreauthor>
	<affiliation>Department of Mechatronics Engineering, College of Engineering, University of Mosul, Mosul, Iraq.</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>Saad G</first_name>
	<middle_name></middle_name>
	<last_name>Muttlak</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email>Saad.g.mutlak@tu.edu.iq</email>
	<code>1800319475328460017211</code>
	<orcid>1800319475328460017211</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of Electrical Engineering, Tikrit University, Tikrit, Iraq.</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>James</first_name>
	<middle_name></middle_name>
	<last_name>Sexton</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email>j.sexton@manchester.ac.uk</email>
	<code>1800319475328460017212</code>
	<orcid>1800319475328460017212</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of Electrical and Electronic Engineering, University of Manchester, Manchester, UK.</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>Michael J</first_name>
	<middle_name></middle_name>
	<last_name>Kelly</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email>mjk1@eng.cam.ac.uk</email>
	<code>1800319475328460017213</code>
	<orcid>1800319475328460017213</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of Electrical Engineering, Cambridge University, Cambridge, UK.</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>Mohamed</first_name>
	<middle_name></middle_name>
	<last_name>Missous</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email>m.missous@manchester.ac.uk</email>
	<code>1800319475328460017214</code>
	<orcid>1800319475328460017214</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of Electrical and Electronic Engineering, University of Manchester, Manchester, UK.</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


</author_list>


	</article>
</articleset>
</journal>
